X-ray/EUV optics for astronomy and microscopy

Conference · Sun Jan 01 00:00:00 EST 1989

OSTI ID:5204773

Hoover, R B

The proceedings of this book are organized under the following headings: X-Ray/EUV zone plates, filters, and windows; X-Ray/EUV microscopes, telescopes, and monochromators; Design, characterization and test of multilayer optics; Fabrication of x-ray/EUV multilayer optics; Design, characterization, and test of grazing incidence x-ray optics; Fabrication of grazing incidence x-ray optics; X-ray/EUV space observations and missions; Test and calibration of x-ray/EUV instruments; X-ray polarimetry; X-ray/EUV spectroscopy and instruments.

• OSTI ID: 5204773
• Report Number(s): CONF-890836-
• Resource Relation: Conference: 33. SPIE annual international technical symposium on optical and optoelectronic applied science and engineering, San Diego, CA (United States), 6-11 Aug 1989
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIFFRACTION GRATINGS
MEETINGS
MONOCHROMATORS
DESIGN
POLARIMETERS
BEAM OPTICS
BRAGG REFLECTION
COSMIC X-RAY SOURCES
EXTREME ULTRAVIOLET RADIATION
LEADING ABSTRACT
MATERIALS TESTING
MIRRORS
OPTICAL PROPERTIES
PHOTOELECTRIC EMISSION
POSITION SENSITIVE DETECTORS
PROPORTIONAL COUNTERS
SPECTROMETERS
TELESCOPES
TUNGSTEN CARBIDES
ABSTRACTS
CARBIDES
CARBON COMPOUNDS
COSMIC RAY SOURCES
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ELECTRON EMISSION
EMISSION
GRATINGS
MEASURING INSTRUMENTS
PHYSICAL PROPERTIES
RADIATION DETECTORS
RADIATIONS
REFLECTION
REFRACTORY METAL COMPOUNDS
TESTING
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN COMPOUNDS
ULTRAVIOLET RADIATION
440600* - Optical Instrumentation- (1990-)
440100 - Radiation Instrumentation