Stress relaxation in unirradiated and in helium ion bombarded glass plates: Dimensional stability
The deformation of thin glass plates during bombardment with 140-keV He/sup +/ ions was measured with an external capacitor. The contour of the plates was determined interferometrically before irradiation, after irradiation, and after aging for several years. These results showed that the calibration of the capacitor equipment by dead-weight loading a silica plate was faulty. The deflection of a vitreous silica free cantilever on dead-weight loading was measured interferometrically, and the results showed that deformation occurred within the clamp. It was confirmed that placing a ground shield about the electrode of the capacitor increases the calculated deflections. Data for the permanent deformation of a stressed plate of vitreous silica are analyzed, and it is concluded that stress relaxation by a bulk viscoelastic deformation cannot be detected by a change in plate contour because the maximum precision for such a determination could not detect apparent viscosities greater than approx.10/sup 29/ P. The stress relaxation of the irradiated vitreous silica plates was about 10% in three years corresponding to an apparent post-irradiation viscosity of approx.10/sup 20/ P. The stress relaxations observed for the other glasses, Pyrex, BK7, and LF2 were much greater, and it is uncertain to what extent they were a viscoelastic effect or an annealing effect. The behavior of a sample of a facsimile radioactive waste storage glass, 76--68 indicated it was not a uniform product; the contour became irregular; hence, these techniques were not appropriate for it.
- Research Organization:
- Materials Science and Technology Division, Argonne National Laboratory, Argonne, Illinois 60439
- OSTI ID:
- 5152563
- Journal Information:
- J. Appl. Phys.; (United States), Vol. 55:4
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
GLASS
DEFORMATION
ION COLLISIONS
PHYSICAL RADIATION EFFECTS
STRESS RELAXATION
HELIUM IONS
COLLISIONS
AGING
CALIBRATION
CAPACITORS
ELASTICITY
ELECTRODES
INTERFEROMETRY
KEV RANGE 100-1000
PLATES
RELAXATION
SILICA
STABILITY
VISCOSITY
CHALCOGENIDES
CHARGED PARTICLES
ELECTRICAL EQUIPMENT
ENERGY RANGE
EQUIPMENT
IONS
KEV RANGE
MECHANICAL PROPERTIES
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
RADIATION EFFECTS
SILICON COMPOUNDS
SILICON OXIDES
TENSILE PROPERTIES
360605* - Materials- Radiation Effects