Electroluminescence yield for {lambda} > 165 nm in neon-xenon mixtures: Experimental results

Conference · Tue Dec 31 00:00:00 EST 1996

OSTI ID:512945

Borges, F I.G.M.; Santos, J M.F. dos; Conde, C A.N. ^[1]; Kubota, S ^[2]

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1. Univ. of Coimbra (Portugal)
2. Rikkyo Univ., Tokyo (Japan)

The electroluminescence yield for {lambda} > 165 am in different neon-xenon mixtures is studied as a function of the reduced electric field. These studies were performed using a uniform-field gas proportional scintillation counter. The experimental values obtained for the scintillation and ionization thresholds decrease from approximately 1 and 6 Vcm{sup -1} torr{sup -1} for 100% xenon, to about 0.5 and 3.8 Vcm{sup -1} torr{sup -1} for 20% xenon, to 0.4 and 2.8 Vcm{sup -1} torr{sup -1} for 10% xenon and to 0.3 and 2.2 Vcm{sup -1} torr{sup -1} for 5% xenon. Detector energy resolutions for the Al K line (1.5 keV) are 15% for 20% xenon, 19% for 10% xenon and 22% for 5% xenon.

• OSTI ID: 512945
• Report Number(s): CONF-961123-; TRN: 97:014006
• Resource Relation: Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Anaheim, CA (United States), 2-9 Nov 1996; Other Information: PBD: 1996; Related Information: Is Part Of 1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3; Del Guerra, A. [ed.]; PB: 2138 p.
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
36 MATERIALS SCIENCE
NEON
ELECTROLUMINESCENCE
XENON
GAS SCINTILLATION DETECTORS
X-RAY DETECTION
MIXTURES