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Title: Spectral and spatial characteristics of x-ray film detectors in the wavelength range 20--150 {angstrom}

Book ·
OSTI ID:505815
; ; ; ; ;  [1];  [2]
  1. Russian Academy of Sciences, Moscow (Russian Federation). P.N. Lebedev Physics Inst.
  2. Lawrence Berkeley Lab., CA (United States)

Investigations of spectral sensitivity, contrast coefficient, and spatial resolution of widely used x-ray films have been undertaken at the P.N. Lebedev Institute. A description of experimental methodologies and results are presented. These studies were carried out using synchrotron radiation in the range of 20--150 {angstrom}. Spectral sensitivity and contrast coefficient dependencies on wavelength for Kodak 10106, DEF, RAR2490, and TPF films and spatial resolution for Kodak 10106 and RAR2490 films are presented and discussed.

DOE Contract Number:
AC03-76SF00098
OSTI ID:
505815
Report Number(s):
CONF-950905-; ISBN 0-7803-2970-8; TRN: 97:013508
Resource Relation:
Conference: 16. IEEE/NPSS symposium on fusion engineering, Champaign, IL (United States), 1-5 Oct 1995; Other Information: PBD: 1995; Related Information: Is Part Of 1995 IEEE 16. symposium on fusion engineering. Volume 1; Miley, G.H.; Elliott, C. [eds.] [Univ. of Illinois, Urbana, IL (United States). Fusion Studies Lab.]; PB: 886 p.
Country of Publication:
United States
Language:
English