High resolution, position sensitive detector for energetic particle beams

Conference · Sat Jun 01 00:00:00 EDT 1991 · AIP Conference Proceedings (American Institute of Physics); (United States)

OSTI ID:5046254

Marsh, E P; Strathman, M D; Reed, D A; Odom, R W ^[1]

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1. Charles Evans and Associates, Redwood City, California (USA)

An imaging position sensitive, particle beam detector is described which is minimally invasive, operates over a wide dynamic range ({gt}10{sup 7}), and exhibits high spatial resolution. The detector images secondary electrons or ions produced when an energetic particle beam passes through a thin foil. These secondary electrons or ions are transported onto a two dimensional imaging detector using stigmatic ion optics. The detector has been employed as a tuning aid for the Ion Microtomography (IMT) system at Sandia National Laboratories and its performance in this application will be discussed.

• DOE Contract Number: AC03-88ER80666
• OSTI ID: 5046254
• Report Number(s): CONF-9010267-; CODEN: APCPC; TRN: 91-031878
• Journal Information: AIP Conference Proceedings (American Institute of Physics); (United States), Vol. 229:1; Conference: 1990 workshop on accelerator instrumentation, Batavia, IL (United States), 1-4 Oct 1990; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM MONITORS
SECONDARY EMISSION DETECTORS
DESIGN
PERFORMANCE
BEAM LUMINOSITY
BEAM POSITION
IMAGES
PARTICLE BEAMS
POSITION SENSITIVE DETECTORS
BEAMS
MEASURING INSTRUMENTS
MONITORS
RADIATION DETECTORS
430100* - Particle Accelerators- Design
Development
& Operation