Tests of the radiation hardness of VLSI integrated circuits and silicon strip detectors for the SSC under neutron, proton, and gamma irradiation

Journal Article · Mon Apr 01 00:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.289308· OSTI ID:5044343

Ziock, H J; Milner, C; Sommer, W F ^[1]; Cartiglia, N; DeWitt, J; Dorfan, D; Hubbard, B; Leslie, J; O'Shaughnesy, K F; Pitzl, D; Rowe, W A; Sadrozinski, H F.W.; Seiden, A; Spencer, E; Tennenbaum, P ^[2]; Ellison, J; Jerger, S; Lietzke, C; Wimpenny, S J ^[3]; Ferguson, P ^[4] ; Giubellino, P ^[5]

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1. Los Alamos National Lab., NM (United States)
2. California Univ., Santa Cruz, CA (United States). Inst. for Particle Physics
3. California Univ., Riverside, CA (United States)
4. Missouri Univ., Rolla, MO (United States)
5. INFN, Torino (IT)

As part of a program to develop a silicon strip central tracking detector system for the Superconducting Super Collider (SSC) we are studying the effects of radiation damage in silicon detectors and their associated front-end readout electronics. In this paper, the authors report on the results of neutron and proton irradiations at the Los Alamos National Laboratory (LANL) and {gamma}-ray irradiations at U.C. Santa Cruz (UCSC). Individual components on single-sided AC-coupled silicon strip detectors and on test structures were tested. Circuits fabricated in a radiation hard CMOS process and individual transistors fabricated using dielectric isolation bipolar technology were also studied. Results indicate that a silicon strip tracking detector system should have a lifetime of at least one decade at the SSC.

• OSTI ID: 5044343
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 38:2; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC EQUIPMENT
RADIATION EFFECTS
SUPERCONDUCTING SUPER COLLIDER
RADIATION DETECTORS
GAMMA RADIATION
INTEGRATED CIRCUITS
IRRADIATION
LANL
NEUTRONS
PROTONS
RADIATION HARDENING
READOUT SYSTEMS
SERVICE LIFE
SILICON
BARYONS
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
ELEMENTS
EQUIPMENT
FERMIONS
HADRONS
HARDENING
IONIZING RADIATIONS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
NATIONAL ORGANIZATIONS
NUCLEONS
PHYSICAL RADIATION EFFECTS
RADIATIONS
SEMIMETALS
STORAGE RINGS
US DOE
US ORGANIZATIONS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems