MULTIPLE THICKNESS TIMES DENSITY GAMMA GAGE
Patent
·
OSTI ID:4817499
A device was developed for measuring simultaneously the thicknesses of two dissimilar materials superimposed on each other, such as coating of one material on another. The apparatus utilizes a double gamma radiation source producing radiation in two narrow band energy levels. The different materials attenuate the two bands of energy unequally with the result that a composite signal is received which can be analyzed to separate out the components due to the differing materials and indicate the thickness or densities of the two layers. (AEC)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-16-027400
- Assignee:
- U.S. Atomic Energy Commission
- Patent Number(s):
- US 3046402
- OSTI ID:
- 4817499
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-62
- Country of Publication:
- United States
- Language:
- English
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OSTI ID:4817499