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Title: X-ray microscopy of multiphase polymeric materials

Book ·
OSTI ID:474593
; ;  [1]; ;  [2];  [3]; ;  [4];  [5]
  1. North Carolina State Univ., Raleigh, NC (United States). Dept. of Physics
  2. DuPont, Wilmington, DE (United States). Experimental Station
  3. Dow Chemical, Freeport, TX (United States). Texas Polymer Center
  4. AlliedSignal Technology, Des Plaines, IL (United States)
  5. IBM Corp., Research Triangle Park, NC (United States)

The authors have utilized the scanning transmission x-ray microscope at Brookhaven National Laboratory to acquire high energy resolution spectra of various polymers and to investigate the bulk characteristics of multiphasic polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. The authors present studies ranging from phase separated liquid crystalline polyesters and polyurethanes to various polymer blends. Improvements in the NEXAFS imaging and spectral acquisition protocol in the recent past provide much improved spectral fidelity and include in situ energy calibration with CO{sub 2}.

OSTI ID:
474593
Report Number(s):
CONF-960401-; ISBN 1-55899-340-1; TRN: IM9723%%486
Resource Relation:
Conference: Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996; Other Information: PBD: 1996; Related Information: Is Part Of Applications of synchrotron radiation techniques to materials science III; Terminello, L.J. [ed.] [Lawrence Livermore National Lab., CA (United States)]; Mini, S.M. [ed.] [Northern Illinois Univ., DeKalb, IL (United States)]; Ade, H. [ed.] [North Carolina State Univ., Raleigh, NC (United States)]; Perry, D.L. [ed.] [Lawrence Berkeley National Lab., CA (United States)]; PB: 265 p.; Materials Research Society symposium proceedings, Volume 437
Country of Publication:
United States
Language:
English