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Title: In-plane and out-of-plane dissipation in {ital c}-axis-oriented (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O {sub x} silver-sheathed tapes

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.364177· OSTI ID:450231
; ;  [1]; ; ; ;  [2]
  1. Institute of Solid State Physics, Chinese Academy of Science, P.O. Box 1129, Hefei 230031
  2. Beijing General Research Institute of Nonferrous Metal, Beijing 100088, Peoples Republic of (China)

The temperature dependence of the out-of-plane and in-plane resistance of a c-axis-oriented (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O {sub x} silver-sheathed tape with high critical current density (J{sub c}{gt}2{times}10{sup 4} A/cm{sup 2}, 77 K, 0 T) has been investigated under applied fields up to 0.9 T. It is found that the in-plane and the out-of-plane resistance transitions are quite different: (1) The out-of-plane zero resistance temperature is much higher than the in-plane one, i.e., T{sub c}{sup ab}(H){lt}T{sub c}{sup c}(H), and the difference increases with magnetic field; (2) the out-of-plane zero resistance temperature corresponds to the c-axis decoupling temperature. These phenomena are attributed to different dissipation mechanisms. The in-plane dissipation at low temperature results from the thermally activated flux{endash}flow, while the out-of-plane dissipation originates from the Josephson junction dissipation of weakly coupled c-axis grain boundaries and/or intrinsic Josephson junctions.{copyright} {ital 1997 American Institute of Physics.}

OSTI ID:
450231
Journal Information:
Journal of Applied Physics, Vol. 81, Issue 3; Other Information: PBD: Feb 1997
Country of Publication:
United States
Language:
English