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Title: Seismic refraction studies on the acoustic basement in the continental shelf of the East Sea, Korea

Conference ·
OSTI ID:413540

Critically refracted seismic waves can be utilized in elucidation of physical properties of a high-impedance acoustic basement, where reflection methods are not effective in general. Quality factor Q was estimated for the high-impedance acoustic basement in the continental shelf of the East Sea, Korea. Various pre-processing steps for the estimation included static correction for gun delay, geometric correction, data interpolation, and Fourier transform. Based on the constant Q model, quality factor was computed for the uppermost layer within the basement using the spectral-ratio method. The computation gives values between 10.4 and 13.6, which fall under the range for water-saturated clastic sedimentary rocks. Using seismic events refracted from the layer boundaries within the acoustic basement in the study area, sedimentary layers were successfully defined. A short window AGC (automatic gain control) is an effective tool to reveal existence of the refraction boundaries. Based on a model for horizontal layers, refraction velocity and thickness were computed for each layer under a short seismic line of 3.75 km long in the continental shelf. From four distinct linear events, three layers were interpreted under the water body of 150 m deep. The computed thickness is 275 m for the top layer and 200 m for the middle one. The corresponding refraction velocities are approximately 3,900 m/s and 5,100 m/s, respectively. The refraction event from the top of the lowest layer suggests that its phase velocity is greater than 6,400 m/s.

OSTI ID:
413540
Report Number(s):
CONF-960525-; TRN: IM9702%%315
Resource Relation:
Conference: 28. offshore technology conference, Houston, TX (United States), 6-9 May 1996; Other Information: PBD: 1996; Related Information: Is Part Of 28. annual offshore technology conference: Proceedings. Volume 1: Geology, earth sciences and environmental factors; PB: 689 p.
Country of Publication:
United States
Language:
English

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