Photoelectron holographic studies of As/Si(100) with sub-angstrom resolution
Journal Article
·
· Physical Review B
The atomic structure of As-terminated Si(100) has been studied using the technique of derivative photoelectron holography. The resulting holographic images clearly resolve a 0.5-{angstrom} shift from the (1 x 1) geometry for each As atom as a result of dimerization. Detecting this shift requires a sub-angstrom resolution that has been difficult to achieve using photoelectron holography. The improvement in resolution can be attributed to a highly anisotropic electron-scattering factor resulting in an emission beacon that helps define the atomic images.
- Research Organization:
- Univ. of Illinois at Urbana-Champaign, IL (United States)
- Sponsoring Organization:
- (US)
- DOE Contract Number:
- FG02-91ER45439
- OSTI ID:
- 40277577
- Journal Information:
- Physical Review B, Vol. 64, Issue 11; Other Information: DOI: 10.1103/PhysRevB.64.113409; Othernumber: PRBMDO000064000011113409000001; 030135PRB; PBD: 15 Sep 2001; ISSN 0163-1829
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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