Multi-parameter-fitting procedure for photothermal infrared radiometry on multilayered and bulk-absorbing solids
Photothermal infrared radiometry has been used for the measurement of thermophysical, optical, and geometrical properties of multilayered samples of paint on a metallic substrate. A special data normalization is applied to reduce the number of sensitive parameters which makes the identification task for the remaining parameters easier. The normalization stabilizes the evaluation of the photothermal signal and makes the infrared radiometry more attractive for applications in the industrial environment. It is shown that modeling and multi-parameter-fitting can be applied successfully to the normalized data for the determination of layer thicknesses. As a side product we can calculate some other physical properties of the sample. {copyright} 2001 American Institute of Physics.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40204198
- Journal Information:
- Journal of Applied Physics, Vol. 89, Issue 12; Other Information: DOI: 10.1063/1.1361241; Othernumber: JAPIAU000089000012007888000001; 006110JAP; PBD: 15 Jun 2001; ISSN 0021-8979
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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