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Title: Surface impedance tensor in amorphous wires with helical anisotropy: Magnetic hysteresis and asymmetry

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.1357119· OSTI ID:40204011

This article concerns the investigation of the magnetic behavior of the surface impedance tensor {cflx {var_sigma}} in CoSiB amorphous wires having a residual torsion stress and a helical anisotropy. The full tensor {cflx {var_sigma}} involving three different components is found by measuring the S{sub 21} parameter at a required excitation with a Hewlett-Packard network/spectrum analyzer at MHz frequencies. In general, the impedance plots versus axial magnetic field H{sub ex} exhibit a hysteresis related to that for the case of static magnetization. The diagonal components of {cflx {var_sigma}} (longitudinal {var_sigma}{sub zz} and circular {var_sigma}{sub {var_phi}{var_phi}}) show a sharp peak in a narrow field interval where the domain walls form and contribute to the ac magnetization dynamics. This peak is not seen for the off-diagonal component {var_sigma}{sub z{var_phi}} ({var_sigma}{sub {var_phi}z}) since the existence of the domain structure suppresses it. Applying a dc bias current results in a gradual transition to a nonhysteretic asymmetrical behavior with an enhanced sensitivity. The portions of the experimental plots associated with the rotational dynamic process are in qualitative agreement with the theory based on a single-domain model. {copyright} 2001 American Institute of Physics.

Sponsoring Organization:
(US)
OSTI ID:
40204011
Journal Information:
Journal of Applied Physics, Vol. 89, Issue 11; Other Information: DOI: 10.1063/1.1357119; Othernumber: JAPIAU000089000011007224000001; 257111MMM; PBD: 1 Jun 2001; ISSN 0021-8979
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English