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Title: Mammography imaging studies using a Laue crystal analyzer

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147502· OSTI ID:389560
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  1. CSRRI, Illinois Institute of Technology, 3301 S. Dearborn, Chicago, IL 60616 (United States)

Synchrotron-based mammography imaging experiments have been performed with monochromatic x-rays in which a Laue crystal placed after the object being imaged has been used to split the beam transmitted through the object. The X27C R&D beamline at the National Synchrotron Light Source was used with the white beam monochromatized by a double crystal Si(111) monochromator tuned to 18 keV. The imaging beam was a thin horizontal line approximately 0.5 mm high by 100 mm wide. Images were acquired in line scan mode with the phantom and detector both scanned together. The detector for these experiments was an image plate. A thin Si(111) Laue analyzer was used to diffract a portion of the beam transmitted through the phantom before the image plate detector. This {open_quote}{open_quote}scatter free{close_quote}{close_quote} diffracted beam was then recorded on the image plate during the phantom scan. Since the thin Laue crystal also transmitted a fraction of the incident beam, this beam was also simultaneously recorded on the image plate. The imaging results are interpreted in terms of an x-ray schliere or refractive index inhomogeneities. The analyzer images taken at various points in the rocking curve will be presented. {copyright} {ital 1996 American Institute of Physics.}

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
DOE Contract Number:
AC02-76CH00016
OSTI ID:
389560
Report Number(s):
CONF-9510119-; ISSN 0034-6748; TRN: 96:027968
Journal Information:
Review of Scientific Instruments, Vol. 67, Issue 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English