skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Polysilicon thin film transistors fabricated on low temperature plastic substrates

Journal Article · · Journal of Vacuum Science and Technology, A
DOI:https://doi.org/10.1116/1.581708· OSTI ID:359799
; ; ;  [1]
  1. Lawrence Livermore National Laboratory, P. O. Box 808, L-271, Livermore, California 94551 (United States)

We present device results from polysilicon thin film transistors (TFTs) fabricated at a maximum temperature of 100&hthinsp;{degree}C on polyester substrates. Critical to our success has been the development of a processing cluster tool containing chambers dedicated to laser crystallization, dopant deposition, and gate oxidation. Our TFT fabrication process integrates multiple steps in this tool, and uses the laser to crystallize deposited amorphous silicon as well as create heavily doped TFT source/drain regions. By combining laser crystallization and doping, a plasma enhanced chemical vapor deposition SiO{sub 2} layer for the gate dielectric, and postfabrication annealing at 150&hthinsp;{degree}C, we have succeeded in fabricating TFTs with I{sub ON}/I{sub OFF} ratios {gt}5{times}10{sup 5} and electron mobilities {gt}40 cm{sup 2}/V&hthinsp;s on polyester substrates. {copyright} {ital 1999 American Vacuum Society.}

OSTI ID:
359799
Report Number(s):
CONF-981126-; ISSN 0734-2101; TRN: 9914M0047
Journal Information:
Journal of Vacuum Science and Technology, A, Vol. 17, Issue 4; Conference: 45. annual American Vacuum Society symposium and topical conference, Baltimore, MD (United States), 2-6 Nov 1998; Other Information: PBD: Jul 1999
Country of Publication:
United States
Language:
English

Similar Records

Polysilicon TFT fabrication on plastic substrates
Conference · Wed Aug 06 00:00:00 EDT 1997 · OSTI ID:359799

High-performance thin-film transistors fabricated using excimer laser processing and grain engineering
Journal Article · Wed Apr 01 00:00:00 EST 1998 · IEEE Transactions on Electron Devices · OSTI ID:359799

Sub-100 deg. C a-Si:H thin-film transistors on plastic substrates with silicon nitride gate dielectrics
Journal Article · Wed Sep 01 00:00:00 EDT 2004 · Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films · OSTI ID:359799