Transient power supply voltage (v{sub DDT}) analysis for detecting IC defects

Conference · Tue Apr 01 00:00:00 EST 1997

OSTI ID:351426

Cole, Jr, E I; Soden, J M; Beegle, R W ^[1]

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1. and others

Transient power supply voltage (V{sub DDT}) analysis is a new testing technique demonstrated as a powerful alternative and complement to I{sub DDQ} testing. V{sub DDT} takes advantage of the limited response time of a voltage supply to the changing power demands of an IC during operation. Changes in the V{sub DD} response time are used to detect increases in power demand with resolutions of 100 nA at 100 kHz, 1 {mu}A at 1 MHz, and 2.5 {mu}A at 1.5 MHz. These current sensitivities have been shown for ICs with quiescent currents < 0.1 {mu}A and > 300 {mu}A. The V{sub DDT} signal acquisition protocols, frequency versus sensitivity tradeoffs, hardware considerations and limitations, data examples, and areas for future research are described.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 351426
• Report Number(s): SAND-97-0797C; CONF-971122-1; ON: DE97005158; TRN: 97:003828
• Resource Relation: Conference: IEEE Computer Society international test conference, Washington, DC (United States), 3-5 Nov 1997; Other Information: PBD: 1997
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
INTEGRATED CIRCUITS
ELECTRICAL TESTING
POWER SUPPLIES
FAILURE MODE ANALYSIS
VOLTAGE DROP