Transient power supply voltage (v{sub DDT}) analysis for detecting IC defects
- and others
Transient power supply voltage (V{sub DDT}) analysis is a new testing technique demonstrated as a powerful alternative and complement to I{sub DDQ} testing. V{sub DDT} takes advantage of the limited response time of a voltage supply to the changing power demands of an IC during operation. Changes in the V{sub DD} response time are used to detect increases in power demand with resolutions of 100 nA at 100 kHz, 1 {mu}A at 1 MHz, and 2.5 {mu}A at 1.5 MHz. These current sensitivities have been shown for ICs with quiescent currents < 0.1 {mu}A and > 300 {mu}A. The V{sub DDT} signal acquisition protocols, frequency versus sensitivity tradeoffs, hardware considerations and limitations, data examples, and areas for future research are described.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 351426
- Report Number(s):
- SAND-97-0797C; CONF-971122-1; ON: DE97005158; TRN: 97:003828
- Resource Relation:
- Conference: IEEE Computer Society international test conference, Washington, DC (United States), 3-5 Nov 1997; Other Information: PBD: 1997
- Country of Publication:
- United States
- Language:
- English
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