Use of a capillary X-ray focused beam to investigate the chemical composition of CdZnTe wafers with high resolution CdZnTe detectors
- EURORAD, Strasbourg (France)
- CNRS, Strasbourg (France). Lab. PHASE
- Univ. Louis Pasteur, Schiltigheim (France)
The control of the concentration of Zn and its fluctuation in the high pressure Bridgman grown CdZnTe crystals is part of the characterization work on the ternary grown ingots grown in house. In order to reach both high sensitivity and high position resolution, the authors have developed a new system consisting of a X-ray generator, coupled to a focusing X-ray capillary, delivering intense beams in the micron scale, since the intensity gain is around a factor of 100 compared to conventional methods. The characteristic X-rays are measured through a high resolution CdZnTe detector (225 eV at 5.9 keV FWHM) cooled by a Peltier system. The results of the investigations on different kinds of crystals will be discussed.
- OSTI ID:
- 323832
- Report Number(s):
- CONF-971201-; TRN: 99:004364
- Resource Relation:
- Conference: 1997 fall meeting of the Materials Research Society, Boston, MA (United States), 1-5 Dec 1997; Other Information: PBD: 1998; Related Information: Is Part Of Semiconductors for room-temperature radiation detector applications 2; James, R.B. [ed.] [Sandia National Labs., Livermore, CA (United States)]; Schlesinger, T.E. [ed.] [Carnegie Mellon Univ., Pittsburgh, PA (United States)]; Siffert, P. [ed.] [Lab. PHASE/CNRS, Strasbourg (France)]; Dusi, W. [ed.] [Inst. TESRE/CNR, Bologna (Italy)]; Squillante, M.R. [ed.] [Radiation Monitoring Devices, Inc., Watertown, MA (United States)]; O`Connell, M. [ed.] [Dept. of Energy, Washington, DC (United States)]; Cuzin, M. [ed.] [LETI/CEA, Grenoble (France)]; PB: 681 p.; Materials Research Society symposium proceedings, Volume 487
- Country of Publication:
- United States
- Language:
- English
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