Characterizing trace metal impurities in optical waveguide materials using x-ray absorption

Conference · Thu Dec 31 00:00:00 EST 1998

OSTI ID:302412

Citrin, P H; Northrup, P A; Atkins, R M; Niu, L; Marcus, M A; Jacobson, D C ^[1]; Glodis, P F ^[2]

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1. Lucent Technologies, Murray Hill, NJ (United States). Bell Labs.
2. Lucent Technologies, Norcross, GA (United States). Bell Labs.

X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.

• Sponsoring Organization: USDOE, Washington, DC (United States)
• OSTI ID: 302412
• Report Number(s): CONF-980405-; TRN: 99:002641
• Resource Relation: Conference: Spring meeting of the Materials Research Society, San Francisco, CA (United States), 13-17 Apr 1998; Other Information: PBD: 1998; Related Information: Is Part Of Applications of synchrotron radiation techniques to materials science 4; Mini, S.M. [ed.] [Northern Illinois Univ., DeKalb, IL (United States)]|[Argonne National Lab., IL (United States)]; Stock, S.R. [ed.] [Georgia Inst. of Tech., Atlanta, GA (United States)]; Perry, D.L. [ed.] [Lawrence Berkeley National Lab., CA (United States)]; Terminello, L.J. [ed.] [Lawrence Livermore National Lab., CA (United States)]; PB: 398 p.; Materials Research Society symposium proceedings, Volume 524
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATION
OPTICAL FIBERS
IMPURITIES
METALS
SILICON OXIDES
X RADIATION
X-RAY FLUORESCENCE ANALYSIS
RADIATION ABSORPTION ANALYSIS
MANUFACTURING