A new approach to the analysis of SEU and SEL data to obtain the sensitive volume thickness

Journal Article · Sat Jun 01 00:00:00 EDT 1996 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.510732· OSTI ID:277730

Barak, J; Levinson, J; Akkerman, A; Zentner, A; David, D; Even, O; Lifshitz, Y ^[1]; Hass, M ^[2]; Victoria, M ^[3]

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1. Soreq NRC, Yavne (Israel)
2. Weizmann Inst., Rehovot (Israel)
3. CRPP, Villigen PSI (Switzerland). Fusion Technology Div.

It is proposed to use short-range ions (along with long-range ions) to obtain the thickness of the sensitive volume, d, and the SEU and SEL cross sections vs the energy deposited in this volume, {sigma}{sub ion}({var_epsilon}). These {sigma}{sub ion}({var_epsilon}) and d can be used for calculating the proton induced cross sections {sigma}{sub p}. A study of HM65162 demonstrates this method. The calculated {sigma}{sub p} is in good agreement with the experimental {sigma}{sub p}.

• OSTI ID: 277730
• Report Number(s): CONF-9509107-; ISSN 0018-9499; TRN: 96:018168
• Journal Information: IEEE Transactions on Nuclear Science, Vol. 43, Issue 3Pt1; Conference: 3. European symposium on radiation and its effects on components and systems (RADECS 95), Arcachon (France), 18-22 Sep 1995; Other Information: PBD: Jun 1996
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
SEMICONDUCTOR STORAGE DEVICES
PHYSICAL RADIATION EFFECTS
ENERGY ABSORPTION
DATA ANALYSIS
LET
IONIZING RADIATIONS
CHARGED-PARTICLE TRANSPORT
ERRORS