Long term failure mechanisms of NPN switching transistors
Conference
·
OSTI ID:260524
- Air Force, Hill AFB, UT (United States)
This paper will describe a number of long term failure mechanisms that occurred in a group of switching transistors. The transistors examined are in excess of 20 years old. Of particular interest is the transformation and failure of several of the gold ball bonds. These devices appear to be reaching their ``natural`` wear-out limits--the end of the classic reliability wear-out bathtub curve.
- OSTI ID:
- 260524
- Report Number(s):
- CONF-951156-; ISBN 0-87170-554-0; TRN: IM9632%%166
- Resource Relation:
- Conference: ISTFA `95: 21. international symposium for testing and failure analysis, Santa Clara, CA (United States), 5-10 Nov 1995; Other Information: PBD: 1995; Related Information: Is Part Of ISTFA `95: Conference proceedings; PB: 381 p.
- Country of Publication:
- United States
- Language:
- English
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