ISTFA `95: Conference proceedings
Failure Analysis has evolved greatly during the past decade. Its role in business has become more defined with its impact on customer satisfaction, yield, quality and reliability more clearly understood. At the same time, the costs of performing failure analysis have escalated at a rapid pace. This change in the cost structure has been driven by the greater device complexity and the push to extend existing tools to meet the demands of state-of-the-art analysis. The actual expenditures have also resulted from a better understanding of the return on investment from failure analysis activities. However, it is no longer clear that this effort of extending existing tools will allow the industry to be successful in the analysis of the devices projected by SIA for the turn of the century. In fact, it is fairly clear that the current analysis technology will not be adequate to address the devices projected for the turn of the century, which is a mere 5 years away. In this uncertain environment, electronics companies are coming to realize that failure analysis success must be planned for, that it will not occur by chance. In order to succeed as a failure analyst at the turn of the century, different tools and different skills are likely to be required. Strategies to meet these challenges are crucial to success. In this environment of new tool requirements and higher cost, ISTFA plays a significant role in the dissemination of information and best practices in the failure analysis arena. As planning for the future has become more significant in VLSI failure analysis, ISTFA has expanded its content to include more of this strategic emphasis without abandoning its basic charter to provide a forum for failure analysts of all electronic devices. Separate abstracts were prepared for most papers in this conference.
- OSTI ID:
- 260490
- Report Number(s):
- CONF-951156-; ISBN 0-87170-554-0; TRN: IM9632%%147
- Resource Relation:
- Conference: ISTFA `95: 21. international symposium for testing and failure analysis, Santa Clara, CA (United States), 5-10 Nov 1995; Other Information: PBD: 1995
- Country of Publication:
- United States
- Language:
- English
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