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Title: Development of high-resolution x-ray CT system using parallel beam geometry

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4937501· OSTI ID:22494377
;  [1];  [2];  [3]; ;  [4]; ;  [5]
  1. Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama (Japan)
  2. Institute of Materials Science, High Energy Accelerator Research Organization, Tsukuba, Ibaraki (Japan)
  3. School of Allied Health Sciences, Kitasato University, Sagamihara, Kanagawa (Japan)
  4. Department of Orthodontics, School of Dentistry Showa University, Ota-ku, Tokyo (Japan)
  5. Kyushu Synchrotron Light Research Center, Tosu, Saga (Japan)

For fine three-dimensional observations of large biomedical and organic material samples, we developed a high-resolution X-ray CT system. The system consists of a sample positioner, a 5-μm scintillator, microscopy lenses, and a water-cooled sCMOS detector. Parallel beam geometry was adopted to attain a field of view of a few mm square. A fine three-dimensional image of birch branch was obtained using a 9-keV X-ray at BL16XU of SPring-8 in Japan. The spatial resolution estimated from the line profile of a sectional image was about 3 μm.

OSTI ID:
22494377
Journal Information:
AIP Conference Proceedings, Vol. 1696, Issue 1; Conference: XRM 2014: 12. international conference on X-ray microscopy, Melbourne (Australia), 26-31 Oct 2014; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English