Influence of piezoelectric strain on the Raman spectra of BiFeO{sub 3} films deposited on PMN-PT substrates
- TU Bergakademie Freiberg, Institute of Theoretical Physics, 09596 Freiberg (Germany)
- Institute of Physics, Martin-Luther-University Halle-Wittenberg, 06099 Halle (Germany)
BiFeO{sub 3} epitaxial thin films were deposited on piezoelectric 0.72Pb(Mg{sub 1/3}Nb{sub 2/3})O{sub 3}-0.28PbTiO{sub 3} (PMN-PT) substrates with a conductive buffer layer (La{sub 0.7}Sr{sub 0.3}MnO{sub 3} or SrRuO{sub 3}) using pulsed laser deposition. The calibration of the strain values induced by the electric field applied on the piezoelectric PMN-PT substrates was realised using X-Ray diffraction measurements. The method of piezoelectrically induced strain allows one to directly obtain a quantitative correlation between the strain and the shift of the Raman-active phonons. This is a prerequisite for making Raman scattering a strong tool to probe the strain coupling in multiferroic nanostructures. Using the Poisson's number for BiFeO{sub 3}, one can determine the volume change induced by strain, and therefore the Grüneisen parameters for specific phonon modes.
- OSTI ID:
- 22492703
- Journal Information:
- Applied Physics Letters, Vol. 108, Issue 4; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Ferroelastic domain identification in BiFeO3 crystals using Raman spectroscopy
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journal | January 2019 |
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
BISMUTH COMPOUNDS
BUFFERS
CORRELATIONS
COUPLING
DEPOSITS
ELECTRIC FIELDS
ENERGY BEAM DEPOSITION
EPITAXY
IRON OXIDES
LANTHANUM ALLOYS
LASER RADIATION
LAYERS
LEAD COMPOUNDS
MAGNESIUM COMPOUNDS
NANOSTRUCTURES
NIOBIUM COMPOUNDS
OZONE
PHONONS
PIEZOELECTRICITY
PULSED IRRADIATION
RAMAN EFFECT
RAMAN SPECTRA
RUBIDIUM OXIDES
STRAINS
STRONTIUM COMPOUNDS
SUBSTRATES
THIN FILMS
TITANIUM COMPOUNDS
X-RAY DIFFRACTION