Crystallographic analysis of the implanted TiNi monocrystal containing misoriented localized shear mesobands in its near-surface layer [001]{sub B2}

Journal Article · Tue Oct 27 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4932838· OSTI ID:22492570

Meisner, L. L., E-mail: [e-mail]; Meisner, S. N., E-mail: [e-mail] ^[1]; National Research Tomsk State University, Tomsk, 634050 ^[2]; Tverdokhlebova, A. V., E-mail: [e-mail]; Poletika, T. M., E-mail: [e-mail]; Girsova, S. L., E-mail: [e-mail] ^[1]

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1. Institute of Strength Physics and Materials Science SB RAS, Tomsk, 634055 (Russian Federation)
2. (Russian Federation)

The study was carried on for the implanted single TiNi crystal containing misoriented localized shear mesobands in its near-surface layer [001] B2. Due to the response of material to the Si ion implantation treatment of the single TiNi crystal, deformation mesobands would form in its near-surface layer. Specially designed software tools were employed for the treatment of experimental data obtained from X-ray and electron diffraction patterns. The 3D crystallographic orientations were calculated for the localized shear regions, which were displaced relative to one another and with respect to the original monocrystal orientation.

• OSTI ID: 22492570
• Journal Information: AIP Conference Proceedings, Vol. 1683, Issue 1; Conference: International conference on advanced materials with hierarchical structure for new technologies and reliable structures 2015, Tomsk (Russian Federation), 21-25 Sep 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
36 MATERIALS SCIENCE
COMPUTER CODES
CRYSTALLOGRAPHY
ELECTRON DIFFRACTION
ION IMPLANTATION
LAYERS
MONOCRYSTALS
NICKEL ALLOYS
SHEAR
SILICON IONS
SURFACES
THREE-DIMENSIONAL CALCULATIONS
TITANIUM ALLOYS
X RADIATION