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Title: Single-electron tunneling by using a two-dimensional Corbino nano-scale disk

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4931385· OSTI ID:22492358
 [1];  [2]
  1. Faculty of Education, Hokkaido University of Education, Kita-ku, Sapporo 002-8502 (Japan)
  2. Department of Physics, Faculty of Science, Tokyo University of Science, Tokyo 162-8601 (Japan)

We investigate a single-electron tunneling effect of two-dimensional electron systems formed in the Corbino nano-scale disk. By controlling bias and gate voltages, the transistor using this effect is able to control electrons one by one. The present study focuses on the electronic transmission probability affected by the charging energy in the Corbino-type single-electron transistor. We reformulated the Schrödinger equation for an electron in the Corbino disk in order to consider the effect of the curvature of the disk, taking into account the charging effect on the performance of the Corbino-type single-electron transistor. We formulated the transmission probability of the electron by applying the Wentzel-Kramers-Brillouin (WKB) method. The electron’s energy in the formula of the transmission probability is then associated to the energy eigenvalue of the Schrödinger equation for an electron in an effective confining potential. We numerically solved the Schrödinger equation to evaluate the transmission probability. Our results show that the transmission probability strongly depends on the charging energy stored in the Corbino disk depending on its size.

OSTI ID:
22492358
Journal Information:
AIP Advances, Vol. 5, Issue 9; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
Country of Publication:
United States
Language:
English