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Title: Material degradation of liquid organic semiconductors analyzed by nuclear magnetic resonance spectroscopy

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4928515· OSTI ID:22492303
; ; ;  [1]; ; ;  [2]; ;  [3]
  1. Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011 (Japan)
  2. Center for Organic Photonics and Electronics Research (OPERA), Kyusyu University, 744 Motooka, Nishi, Fukuoka 819-0395 (Japan)
  3. Nissan Chemical Industries, LTD, 722-1 Tsuboi, Funabashi 274-8507 (Japan)

Liquid organic light-emitting diodes (liquid OLEDs) are unique devices consisting only of liquid organic semiconductors in the active layer, and the device performances have been investigated recently. However, the device degradation, especially, the origin has been unknown. In this study, we show that material degradation occurs in liquid OLEDs, whose active layer is composed of carbazole with an ethylene glycol chain. Nuclear magnetic resonance (NMR) experiments clearly exhibit that the dimerization reaction of carbazole moiety occurs in the liquid OLEDs during driving the devices. In contrast, cleavages of the ethylene glycol chain are not detected within experimental error. The dimerization reaction is considered to be related to the device degradation.

OSTI ID:
22492303
Journal Information:
AIP Advances, Vol. 5, Issue 8; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
Country of Publication:
United States
Language:
English