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Title: Identification of an organic semiconductor superlattice structure of pentacene and perfluoro-pentacene through resonant and non-resonant X-ray scattering

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4936884· OSTI ID:22492212
;  [1]; ; ;  [2]; ;  [3];  [4]
  1. Humboldt-Universität zu Berlin, Institut für Physik, Newtonstr. 15, 12489 Berlin (Germany)
  2. Universität Tübingen, Institut für Angewandte Physik, Auf der Morgenstelle 10, 72076 Tübingen (Germany)
  3. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
  4. Departments of Chemistry and Physics, University of California, and Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

Highly crystalline and stable molecular superlattices are grown with the smallest possible stacking period using monolayers (MLs) of the organic semiconductors pentacene (PEN) and perfluoro-pentacene (PFP). Superlattice reflections in X-ray reflectivity and their energy dependence in resonant soft X-ray reflectivity measurements show that PFP and PEN MLs indeed alternate even though the coherent ordering is lost after ∼ 4 ML. The observed lattice spacing of 15.9 Å in the superlattice is larger than in pure PEN and PFP films, presumably because of more upright standing molecules and lack of interdigitation between the incommensurate crystalline PEN and PFP layers. The findings are important for the development of novel organic quantum optoelectronic devices.

OSTI ID:
22492212
Journal Information:
AIP Advances, Vol. 5, Issue 11; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
Country of Publication:
United States
Language:
English

Cited By (2)

Molecular Semiconductors for Logic Operations: Dead‐End or Bright Future? journal January 2020
Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystal journal March 2019