Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell

Journal Article · Sun Nov 15 00:00:00 EST 2015 · AIP Advances

DOI:https://doi.org/10.1063/1.4935913· OSTI ID:22492184

Nakanishi, Hidetoshi; Ito, Akira ^[1]; Takayama, Kazuhisa; Kawayama, Iwao; Murakami, Hironaru; Tonouchi, Masayoshi ^[2]

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1. SCREEN Holdings Co., Ltd., Kyoto, 612-8486 (Japan)
2. Institute of Laser Engineering, Osaka University, Suita, 565-0871 (Japan)

A laser terahertz emission microscope (LTEM) can be used for noncontact inspection to detect the waveforms of photoinduced terahertz emissions from material devices. In this study, we experimentally compared the performance of LTEM with conventional analysis methods, e.g., electroluminescence (EL), photoluminescence (PL), and laser beam induced current (LBIC), as an inspection method for solar cells. The results showed that LTEM was more sensitive to the characteristics of the depletion layer of the polycrystalline solar cell compared with EL, PL, and LBIC and that it could be used as a complementary tool to the conventional analysis methods for a solar cell.

• OSTI ID: 22492184
• Journal Information: AIP Advances, Vol. 5, Issue 11; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
COMPARATIVE EVALUATIONS
DEPLETION LAYER
ELECTROLUMINESCENCE
LASER RADIATION
PERFORMANCE
PHOTOLUMINESCENCE
POLYCRYSTALS
SILICON SOLAR CELLS
THZ RANGE
WAVE FORMS