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Title: Impact of thermal treatment on the optical performance of InGaN/GaN light emitting diodes

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4934491· OSTI ID:22492132
; ;  [1]; ;  [2]; ; ;  [3];  [4];  [5]
  1. University of Padova, Department of Information Engineering, via Gradenigo 6/B, 35131 Padova (Italy)
  2. University of Cambridge, Dept. Materials Science & Metallurgy, Cambridge, CB2 3QZ (United Kingdom)
  3. University of Padova, Department of Physics, and Astronomy via Marzolo 8 35131 Padova (Italy)
  4. University of Florence, Department of Physics, Via Sansone, 1 - 50019 Sesto Fiorentino (Italy)
  5. University of Florence, Department of Engineering, Via di Santa Marta, 3, 50139 Firenze (Italy)

This paper describes a detailed analysis of the effects of high temperatures on the optical performance and structural characteristics of GaN-based LED structures with a high threading dislocation density. Results show that, as a consequence of storage at 900 °C in N{sub 2} atmosphere, the samples exhibit: (i) an increase in the efficiency of GaN and quantum-well luminescence, well correlated to an increase in carrier lifetime; (ii) a decrease in the parasitic luminescence peaks related to Mg acceptors, which is correlated to the reduction in the concentration of Mg in the p-type region, detected by Secondary Ion Mass Spectroscopy (SIMS); (iii) a diffusion of acceptor (Mg) atoms to the quantum well region; (iv) a reduction in the yield of Rutherford Backscattering Spectrometry (RBS)-channeling measurements, possibly due to a partial re-arrangement of the dislocations, which is supposed to be correlated to the increase in radiative efficiency (see (i))

OSTI ID:
22492132
Journal Information:
AIP Advances, Vol. 5, Issue 10; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
Country of Publication:
United States
Language:
English