Microwave synthesis and electrochemical characterization of Mn/Ni mixed oxide for supercapacitor application
- Department of Nanoscience and Technology, Alagappa University, Karaikudi-630003, Tamil Nadu (India)
Nanostructured Mn/Ni mixed metal oxide was synthesized at ambient temperature by facile microwave irradiation technique. The crystal structure and surface morphology were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. X-ray diffraction analysis confirmed the formation of Mn/Ni mixed oxide in rhombohedral phase and the grain size calculated was found to be 87 nm. The irregular spherical morphology of the prepared sample was exhibited by the SEM images. The characteristic peaks of FTIR at about 630 cm{sup −1} and 749 cm{sup −1} were attributed to the Mn-O and Ni-O stretching vibrations respectively. The presence of both Mn and Ni in the prepared sample was validated by the EDS spectra which in turn confirmed the formation of mixed oxide. Cyclic voltammetry and galvanostatic chargedischarge measurements were employed to investigate the electrochemical performance of the mixed oxide. The cyclic voltammetry curves demonstrated good capacitive performance of the sample in the potential window −0.2V to 0.9V. The charge discharge study revealed the suitability of the prepared mixed oxide for the fabrication of supercapacitor electrode.
- OSTI ID:
- 22490341
- Journal Information:
- AIP Conference Proceedings, Vol. 1665, Issue 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIAGRAMS
ELECTROCHEMISTRY
FOURIER TRANSFORMATION
GRAIN SIZE
INFRARED SPECTRA
IRRADIATION
MANGANESE OXIDES
MICROWAVE RADIATION
MORPHOLOGY
NANOSTRUCTURES
NICKEL OXIDES
SCANNING ELECTRON MICROSCOPY
SURFACES
SYNTHESIS
TRIGONAL LATTICES
VOLTAMETRY
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY