Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy

Watanabe, Yoshihide; Nishimura, Yusaku F.; Suzuki, Ryo; Beniya, Atsushi; Isomura, Noritake; Uehara, Hiromitsu; Asakura, Kiyotaka; Takakusagi, Satoru; Nimura, Tomoyuki

doi:10.1116/1.4936344

Title: Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy

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Abstract

A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt{sub 4} clusters deposited on a TiO{sub 2}(110) surface.

Authors:

Watanabe, Yoshihide; Nishimura, Yusaku F.; Suzuki, Ryo; Beniya, Atsushi; Isomura, Noritake ^[1]; Uehara, Hiromitsu; Asakura, Kiyotaka; Takakusagi, Satoru ^[2]; Nimura, Tomoyuki ^[3]

Toyota Central R&D Labs., Inc., Yokomichi 41-1, Nagakute, Aichi 480-1192 (Japan)
Catalysis Research Center, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021 (Japan)
AVC Co., Ltd., Inada 1450-6, Hitachinaka, Ibaraki 312-0061 (Japan)

Publication Date:: Tue Mar 15 00:00:00 EDT 2016

OSTI Identifier:: 22489813

Resource Type:: Journal Article

Journal Name:: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films

Additional Journal Information:: Journal Volume: 34; Journal Issue: 2; Other Information: (c) 2015 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0734-2101

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 42 ENGINEERING; ABSORPTION SPECTROSCOPY; DESIGN; FINE STRUCTURE; FLUORESCENCE; POLARIZATION; PRESSURE RANGE BELOW 1 NANO PA; SUBSTRATES; SURFACES; SYNCHROTRON RADIATION; TITANIUM OXIDES; X-RAY SPECTROSCOPY

Citation Formats


                    Watanabe, Yoshihide, Nishimura, Yusaku F., Suzuki, Ryo, Beniya, Atsushi, Isomura, Noritake, Uehara, Hiromitsu, Asakura, Kiyotaka, Takakusagi, Satoru, and Nimura, Tomoyuki. Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy.  United States: N. p., 2016. 
        Web.  doi:10.1116/1.4936344.

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                    Watanabe, Yoshihide, Nishimura, Yusaku F., Suzuki, Ryo, Beniya, Atsushi, Isomura, Noritake, Uehara, Hiromitsu, Asakura, Kiyotaka, Takakusagi, Satoru, & Nimura, Tomoyuki. Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy.  United States.  https://doi.org/10.1116/1.4936344

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                    Watanabe, Yoshihide, Nishimura, Yusaku F., Suzuki, Ryo, Beniya, Atsushi, Isomura, Noritake, Uehara, Hiromitsu, Asakura, Kiyotaka, Takakusagi, Satoru, and Nimura, Tomoyuki. 2016.  
        "Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy".  United States.  https://doi.org/10.1116/1.4936344.

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@article{osti_22489813,

  title        = {Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy},

  author       = {Watanabe, Yoshihide and Nishimura, Yusaku F. and Suzuki, Ryo and Beniya, Atsushi and Isomura, Noritake and Uehara, Hiromitsu and Asakura, Kiyotaka and Takakusagi, Satoru and Nimura, Tomoyuki},

  abstractNote = {A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt{sub 4} clusters deposited on a TiO{sub 2}(110) surface.},

  doi          = {10.1116/1.4936344},

  url          = {https://www.osti.gov/biblio/22489813},
  journal      = {Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films},

  issn         = {0734-2101},

  number       = 2,

  volume       = 34,

  place        = {United States},

  year         = {Tue Mar 15 00:00:00 EDT 2016},

  month        = {Tue Mar 15 00:00:00 EDT 2016}

}

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