Pressure-induced structures of Si-doped HfO{sub 2}
- Department of Materials Science and Engineering, North Carolina State University Raleigh, North Carolina 27695 (United States)
- HPCAT, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, Illinois 60439 (United States)
The effect of hydrostatic pressure on the structure of Si-doped HfO{sub 2} (Si:HfO{sub 2}) was studied by using a diamond anvil cell in combination with high-energy X-ray diffraction at a synchrotron source. Diffraction data were measured in situ during compression up to pressures of 31 GPa. Si:HfO{sub 2} with 3, 5, and 9 at. % Si were found to undergo a monoclinic to orthorhombic transition at pressures between 7 and 15 GPa. Whole pattern analysis was carried out using nonpolar (Pbca) and polar (Pca2{sub 1}) crystallographic models to investigate the symmetry of the observed high-pressure orthorhombic phase. Rietveld refinement results cannot discriminate a reliable difference between the Pbca and Pca2{sub 1} structures as they nearly equally model the measured diffraction data. The pressure dependent lattice parameters, relative volume, and spontaneous strain are reported.
- OSTI ID:
- 22489441
- Journal Information:
- Journal of Applied Physics, Vol. 117, Issue 23; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COMPRESSION
CRYSTALLOGRAPHY
DIAMONDS
DOPED MATERIALS
HAFNIUM OXIDES
LATTICE PARAMETERS
MONOCLINIC LATTICES
ORTHORHOMBIC LATTICES
PRESSURE DEPENDENCE
PRESSURE RANGE GIGA PA
STRAINS
SYMMETRY
SYNCHROTRON RADIATION SOURCES
X-RAY DIFFRACTION