Self-detection of x-ray Fresnel transmissivity using photoelectron-induced gas ionization

Journal Article · Mon Jan 25 00:00:00 EST 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4940908· OSTI ID:22489340

Stoupin, Stanislav ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, Lemont, Illinois 60439 (United States)

Electric response of an x-ray mirror enclosed in a gas flow ionization chamber was studied under the conditions of total external reflection for hard x-rays. It is shown that the electric response of the system as a function of the incidence angle is defined by x-ray Fresnel transmissivity and photon-electron attenuation properties of the mirror material. A simple interpretation of quantum yield of the system is presented. The approach could serve as a basis for non-invasive in situ diagnostics of hard x-ray optics, easy access to complementary x-ray transmissivity data in x-ray reflectivity experiments, and might also pave the way to advanced schemes for angle and energy resolving x-ray detectors.

• OSTI ID: 22489340
• Journal Information: Applied Physics Letters, Vol. 108, Issue 4; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ATTENUATION
DETECTION
GAS FLOW
HARD X RADIATION
INCIDENCE ANGLE
IONIZATION CHAMBERS
MIRRORS
PHOTONS
REFLECTIVITY