Passive microrheology of soft materials with atomic force microscopy: A wavelet-based spectral analysis
- CNRS, UMR5672, Laboratoire de Physique, Ecole Normale Supérieure de Lyon, 46 Allée d'Italie, Université de Lyon, 69007 Lyon (France)
- Université Paris-Est, Ecole des Ponts ParisTech, SDOA, MAST, IFSTTAR, 14-20 Bd Newton, Cité Descartes, 77420 Champs sur Marne (France)
Compared to active microrheology where a known force or modulation is periodically imposed to a soft material, passive microrheology relies on the spectral analysis of the spontaneous motion of tracers inherent or external to the material. Passive microrheology studies of soft or living materials with atomic force microscopy (AFM) cantilever tips are rather rare because, in the spectral densities, the rheological response of the materials is hardly distinguishable from other sources of random or periodic perturbations. To circumvent this difficulty, we propose here a wavelet-based decomposition of AFM cantilever tip fluctuations and we show that when applying this multi-scale method to soft polymer layers and to living myoblasts, the structural damping exponents of these soft materials can be retrieved.
- OSTI ID:
- 22489339
- Journal Information:
- Applied Physics Letters, Vol. 108, Issue 3; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Similar Records
Imaging of surface nanobubbles by atomic force microscopy in liquids: Influence of drive frequency on the characterization of ultrasoft matter: Surface Nanobubbles and Soft Matter by AFM
Few-cycle Regime Atomic Force Microscopy