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Title: Evidence of interfacial charge trapping mechanism in polyaniline/reduced graphene oxide nanocomposites

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4927591· OSTI ID:22489060
; ;  [1];  [2];  [3]
  1. University of Lille, Sciences & Technologies, Unité Matériaux et Transformations (UMET), UMR CNRS 8207, U.F.R. de Physique, P5, 59655 Villeneuve d'Ascq Cedex (France)
  2. Physics Department, Solid State Physics Section, University of Athens, Panepistimiopolis, GR15784 Zografos, Athens (Greece)
  3. Science Division, University of Science and Arts of Oklahoma, Chickasha, Oklahoma 73018 (United States)

Relaxation mechanisms in polyaniline (PANI)/Reduced Graphene Oxide (RGO) nanocomposites are investigated using broad band dielectric spectroscopy. The multilayered nanostructural features of the composites and the intimate interactions between PANI and RGO are evidenced by field emission scanning electron microscopy, transmission electron microscopy, and Raman spectroscopy. Increasing the RGO fraction in the composites results in a relaxation process observed at a frequency of ca. 5 kHz. This mechanism is associated with an electrical charge trapping phenomenon occurring at the PANI/RGO interfaces. The dielectric relaxation processes are interpreted according to the Sillars approach and the results are consistent with the presence of conducting prolate spheroids (RGO) embedded into a polymeric matrix (PANI). Dielectric permittivity data are analyzed within the framework of the Kohlrausch-William-Watts model, evidencing a Debye-like relaxation process.

OSTI ID:
22489060
Journal Information:
Applied Physics Letters, Vol. 107, Issue 5; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English