Inelastic x-ray scattering studies on dynamic structure factor of polymeric liquid Se under pressure

Journal Article · Mon Aug 17 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4928256· OSTI ID:22488743

Inui, Masanori; Kajihara, Yukio ^[1]; Kimura, Koji; Matsuda, Kazuhiro ^[2]; Ohara, Koji; Tsutsui, Satoshi; Ishikawa, Daisuke ^[3]; Baron, Alfred Q. ^[4]

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1. Graduate School of Integrated Arts and Sciences, Hiroshima University, Higashi-Hiroshima, Hiroshima 739-8521 (Japan)
2. Department of Physics, Kyoto University, Sakyoku, Kyoto 606-8502 (Japan)
3. Japan Synchrotron Radiation Research Institute/SPring-8, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)
4. RIKEN HARIMA BRANCH, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)

Inelastic X-ray scattering measurements at 25 MPa using synchrotron radiation were carried out for semiconducting liquid Se at high temperatures up to 1673 K. The excitation energy of the acoustic mode disperses approximately 10-50 % faster than the ultrasonic sound velocity in the observed temperature range while the ultrasonic sound rapidly slows down with increasing temperature. We carried out X-ray scattering measurements and found that the average coordination number at 1673 K is 1.3, indicating that the high temperature liquid consists of short chain molecules. These results suggest that weakening of the interatomic interaction is correlated with breaking of polymeric chain molecules.

• OSTI ID: 22488743
• Journal Information: AIP Conference Proceedings, Vol. 1673, Issue 1; Conference: LAM-15: 15. international conference on liquid and amorphous metals, Beijing (China), 15-20 Sep 2013; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AUGMENTATION
COORDINATION NUMBER
EXCITATION
INELASTIC SCATTERING
LIQUIDS
MOLECULES
PRESSURE DEPENDENCE
SOUND WAVES
STRUCTURE FACTORS
SYNCHROTRON RADIATION
TEMPERATURE DEPENDENCE
VELOCITY
X-RAY DIFFRACTION