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Title: Determination of band offsets at the Al:ZnO/Cu{sub 2}SnS{sub 3} interface using X-ray photoelectron spectroscopy

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4919111· OSTI ID:22488545

The Al:ZnO/Cu{sub 2}SnS{sub 3} semiconductor heterojunction was fabricated. The structural and optical properties of the semiconductor materials were studied. The band offset at the Al:ZnO/Cu{sub 2}SnS{sub 3} heterojunction was studied using X-ray photoelectron spectroscopy technique. From the measurement of the core level energies and valence band maximum of the constituent elements, the valence band offset was calculated to be −1.1 ± 0.24 eV and the conduction band offset was 0.9 ± 0.34 eV. The band alignment at the heterojunction was found to be of type-I. The study of Al:ZnO/Cu{sub 2}SnS{sub 3} heterojunction is useful for solar cell applications.

OSTI ID:
22488545
Journal Information:
AIP Advances, Vol. 5, Issue 4; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
Country of Publication:
United States
Language:
English