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Title: Thermal transport across few-layer boron nitride encased by silica

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4927240· OSTI ID:22486329
;  [1]; ;  [2]
  1. Department of Mechanical Engineering, University of Minnesota, 111 Church Street SE, Minneapolis, Minnesota 55455 (United States)
  2. Department of Materials Science and Engineering, University of Texas at Arlington, 501 West First St., Arlington, Texas 76019 (United States)

Two dimensional hexagonal boron nitride (h-BN) attracted attention for use in applications. Using equilibrium molecular dynamics, we examine the phonon transport in few-layer h-BN encased by silica (SiO{sub 2}). We report large interfacial thermal resistances, of about 2.2 × 10{sup −8} m{sup 2} K W{sup −1}, which are not sensitive to the number of h-BN layers or the SiO{sub 2} crystallinity. The h-BN/SiO{sub 2} superlattices exhibit ultra-low thermal conductivities across layers, as low as 0.3 W/m K. They are structurally stable up to 2000 K while retaining the low-thermal conductivity attributes. Our simulations indicate that incorporation of h-BN layers and nanoparticles in silica could establish thermal barriers and heat spreading paths, useful for high performance coatings and electronic device applications.

OSTI ID:
22486329
Journal Information:
Applied Physics Letters, Vol. 107, Issue 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English