Measurement of reflectivity of spherically bent crystals using Kα signal from hot electrons produced by laser-matter interaction
Journal Article
·
· Review of Scientific Instruments
- Université Bordeaux 1, CNRS, CEA, CELIA (Centre Lasers Intenses et Applications), UMR 5107, F-33405 Talence (France)
- Institute for Academic Initiatives, Osaka University, Suita 565-0871 (Japan)
- Joint Institute for High Temperatures, Russian Academy of Sciences, Moscow 125412 (Russian Federation)
In an experiment at the laser facility ECLIPSE of the CELIA laboratory, University of Bordeaux, we measure the reflectivity of spherically bent crystals that are commonly used to investigate the propagation of fast electrons through the Kα radiation they generate in matter. The experimental reflectivity compares well with predictions from a ray-tracing code that takes into account the specific geometry, although the crystals seem to suffer from aging problems.
- OSTI ID:
- 22482710
- Journal Information:
- Review of Scientific Instruments, Vol. 86, Issue 7; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
Method for characterization of a spherically bent crystal for K.alpha. X-ray imaging of laser plasmas using a focusing monochromator geometry
Prototype grooved and spherically bent Si backscattering crystal analyzer for meV resolution inelastic x-ray scattering
The Crystal Backlighter Imager: A spherically bent crystal imager for radiography on the National Ignition Facility
Patent
·
Tue Apr 07 00:00:00 EDT 2015
·
OSTI ID:22482710
+3 more
Prototype grooved and spherically bent Si backscattering crystal analyzer for meV resolution inelastic x-ray scattering
Journal Article
·
Wed Feb 01 00:00:00 EST 1995
· Review of Scientific Instruments; (United States)
·
OSTI ID:22482710
The Crystal Backlighter Imager: A spherically bent crystal imager for radiography on the National Ignition Facility
Journal Article
·
Wed Jan 16 00:00:00 EST 2019
· Review of Scientific Instruments
·
OSTI ID:22482710
+24 more