Image contrast reversals in contact resonance atomic force microscopy
- Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, Anhui 230026 (China)
Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered.
- OSTI ID:
- 22454450
- Journal Information:
- AIP Advances, Vol. 5, Issue 2; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
- Country of Publication:
- United States
- Language:
- English
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