Laboratory detections of SiC{sub 2}N and SiC{sub 3}N by Fourier transform microwave spectroscopy

Umeki, Hiroya; Nakajima, Masakazu; Endo, Yasuki

doi:10.1063/1.4900740

Title: Laboratory detections of SiC{sub 2}N and SiC{sub 3}N by Fourier transform microwave spectroscopy

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Abstract

Two silicon-bearing carbon chain radicals, SiC{sub 2}N and SiC{sub 3}N, were detected in the laboratory by Fourier transform microwave spectroscopy. Molecular constants including the hyperfine coupling constants have been determined for the two radicals in the ground electronic states. The SiC{sub 2}N and SiC{sub 3}N radicals have linear structures in the {sup 2}Π ground electronic states with inverted and regular fine structures, respectively, as are the cases for their isoelectronic radicals, SiC{sub 3}H and SiC{sub 4}H, indicating that the SiC{sub n}N radicals have similar electronic structures to the SiC{sub n+1}H radicals. The electronic structures of SiC{sub 2}N and SiC{sub 3}N in the ground states are discussed on the basis of the experimentally determined molecular constants.

Authors:

Umeki, Hiroya; Nakajima, Masakazu; Endo, Yasuki ^[1]

Department of Basic Science, Graduate School of Arts and Sciences, The University of Tokyo, Komaba, Meguro-ku, Tokyo 153-8902 (Japan)

Publication Date:: Fri Nov 14 00:00:00 EST 2014

OSTI Identifier:: 22415349

Resource Type:: Journal Article

Journal Name:: Journal of Chemical Physics

Additional Journal Information:: Journal Volume: 141; Journal Issue: 18; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-9606

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; CARBON; COUPLING CONSTANTS; DETECTION; ELECTRONIC STRUCTURE; FINE STRUCTURE; FOURIER TRANSFORMATION; GROUND STATES; RADICALS; SILICON; SILICON CARBIDES; SPECTROSCOPY

Citation Formats


                    Umeki, Hiroya, Nakajima, Masakazu, and Endo, Yasuki. Laboratory detections of SiC{sub 2}N and SiC{sub 3}N by Fourier transform microwave spectroscopy.  United States: N. p., 2014. 
        Web.  doi:10.1063/1.4900740.

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                    Umeki, Hiroya, Nakajima, Masakazu, & Endo, Yasuki. Laboratory detections of SiC{sub 2}N and SiC{sub 3}N by Fourier transform microwave spectroscopy.  United States.  https://doi.org/10.1063/1.4900740

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                    Umeki, Hiroya, Nakajima, Masakazu, and Endo, Yasuki. 2014.  
        "Laboratory detections of SiC{sub 2}N and SiC{sub 3}N by Fourier transform microwave spectroscopy".  United States.  https://doi.org/10.1063/1.4900740.

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@article{osti_22415349,

  title        = {Laboratory detections of SiC{sub 2}N and SiC{sub 3}N by Fourier transform microwave spectroscopy},

  author       = {Umeki, Hiroya and Nakajima, Masakazu and Endo, Yasuki},

  abstractNote = {Two silicon-bearing carbon chain radicals, SiC{sub 2}N and SiC{sub 3}N, were detected in the laboratory by Fourier transform microwave spectroscopy. Molecular constants including the hyperfine coupling constants have been determined for the two radicals in the ground electronic states. The SiC{sub 2}N and SiC{sub 3}N radicals have linear structures in the {sup 2}Π ground electronic states with inverted and regular fine structures, respectively, as are the cases for their isoelectronic radicals, SiC{sub 3}H and SiC{sub 4}H, indicating that the SiC{sub n}N radicals have similar electronic structures to the SiC{sub n+1}H radicals. The electronic structures of SiC{sub 2}N and SiC{sub 3}N in the ground states are discussed on the basis of the experimentally determined molecular constants.},

  doi          = {10.1063/1.4900740},

  url          = {https://www.osti.gov/biblio/22415349},
  journal      = {Journal of Chemical Physics},

  issn         = {0021-9606},

  number       = 18,

  volume       = 141,

  place        = {United States},

  year         = {Fri Nov 14 00:00:00 EST 2014},

  month        = {Fri Nov 14 00:00:00 EST 2014}

}

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