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Title: Critical CuI buffer layer surface density for organic molecular crystal orientation change

We have determined the critical surface density of the CuI buffer layer inserted to change the preferred orientation of copper phthalocyanine (CuPc) crystals grown on the buffer layer. X-ray reflectivity measurements were performed to obtain the density profiles of the buffer layers and out-of-plane and 2D grazing-incidence X-ray diffraction measurements were performed to determine the preferred orientations of the molecular crystals. Remarkably, it was found that the preferred orientation of the CuPc film is completely changed from edge-on (1 0 0) to face-on (1 1 −2) by a CuI buffer layer with a very low surface density, so low that a large proportion of the substrate surface is bare.
Authors:
; ;  [1] ;  [2] ;  [3]
  1. Department of Physics, Soongsil University, Seoul 156-743 (Korea, Republic of)
  2. Department of Organic Material Science and Engineering, Pusan National University, Busan 609-735 (Korea, Republic of)
  3. Pohang Accelerator Laboratory, POSTECH, Pohang 790-784 (Korea, Republic of)
Publication Date:
OSTI Identifier:
22412975
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COPPER COMPLEXES; COPPER COMPOUNDS; COPPER IODIDES; CRYSTAL STRUCTURE; FILMS; GRAIN ORIENTATION; LAYERS; MOLECULAR CRYSTALS; PHTHALOCYANINES; REFLECTIVITY; SUBSTRATES; SURFACES; X RADIATION; X-RAY DIFFRACTION