Critical CuI buffer layer surface density for organic molecular crystal orientation change

Journal Article · Wed Jan 21 00:00:00 EST 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4906216· OSTI ID:22412975

Ahn, Kwangseok; Kim, Jong Beom

We have determined the critical surface density of the CuI buffer layer inserted to change the preferred orientation of copper phthalocyanine (CuPc) crystals grown on the buffer layer. X-ray reflectivity measurements were performed to obtain the density profiles of the buffer layers and out-of-plane and 2D grazing-incidence X-ray diffraction measurements were performed to determine the preferred orientations of the molecular crystals. Remarkably, it was found that the preferred orientation of the CuPc film is completely changed from edge-on (1 0 0) to face-on (1 1 −2) by a CuI buffer layer with a very low surface density, so low that a large proportion of the substrate surface is bare.

• OSTI ID: 22412975
• Journal Information: Journal of Applied Physics, Vol. 117, Issue 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COPPER COMPLEXES
COPPER COMPOUNDS
COPPER IODIDES
CRYSTAL STRUCTURE
FILMS
GRAIN ORIENTATION
LAYERS
MOLECULAR CRYSTALS
PHTHALOCYANINES
REFLECTIVITY
SUBSTRATES
SURFACES
X RADIATION
X-RAY DIFFRACTION