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Title: Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4907949· OSTI ID:22412587
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  1. Institute for Methods and Instrumentation in Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin (Germany)
  2. Institute for Nanostructure and Solid State Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany and Max Planck Institute for the Structure and Dynamics of Matter, Center for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg (Germany)
  3. Department of Chemistry, University of Washington, Box 351700, Seattle, Washington 98195 (United States)
  4. LCLS, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States)

The discovery of ultrafast X-ray induced optical reflectivity changes enabled the development of X-ray/optical cross correlation techniques at X-ray free electron lasers worldwide. We have now linked through experiment and theory the fundamental excitation and relaxation steps with the transient optical properties in finite solid samples. Therefore, we gain a thorough interpretation and an optimized detection scheme of X-ray induced changes to the refractive index and the X-ray/optical cross correlation response.

OSTI ID:
22412587
Journal Information:
Applied Physics Letters, Vol. 106, Issue 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English