High-resolution electron microscopy in spin pumping NiFe/Pt interfaces

Journal Article · Thu May 07 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4914126· OSTI ID:22410112

Sáenz-Hernández, R. J.; Faudoa Arzate, A.; Arteaga Duran, A. I.; Ornelas Gutiérrez, C. E.; Solís Canto, O.; Botello-Zubiate, M. E.; Rivera-Gómez, F. J.; Matutes-Aquino, J. A. ^[1]; Azevedo, A.; Silva, G. L. da; Rezende, S. M. ^[2]

---

1. Centro de Investigación en Materiales Avanzados, S.C., Miguel de Cervantes 120, Complejo Industrial Chihuahua, Chihuahua 31109 (Mexico)
2. Departamento de Física, Universidade Federal de Pernambuco, 50670-901 Recife, PE (Brazil)

In order to understand the effect of the interface on the spin pumping and magnetic proximity effects, high resolution transmission electron microscopy and ferromagnetic resonance (FMR) were used to analyze Py/Pt bilayer and Pt/Py/Pt trilayer systems. The samples were deposited by dc magnetron sputtering at room temperature on Si (001) substrates. The Py layer thickness was fixed at 12 nm in all the samples and the Pt thickness was varied in a range of 0–23 nm. A diffusion zone of approximately 8 nm was found in the Py/Pt interfaces and confirmed by energy dispersive X-ray microanalysis. The FMR measurements show an increase in the linewidth and a shift in the ferromagnetic resonance field, which reach saturation.

• OSTI ID: 22410112
• Journal Information: Journal of Applied Physics, Vol. 117, Issue 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
APPROXIMATIONS
DIFFUSION
FERROMAGNETIC RESONANCE
INTERFACES
INTERMETALLIC COMPOUNDS
IRON
LAYERS
MICROANALYSIS
NICKEL
PLATINUM
RESOLUTION
SILICON
SPIN
SPUTTERING
SUBSTRATES
TEMPERATURE RANGE 0273-0400 K
THICKNESS
TRANSMISSION ELECTRON MICROSCOPY
X RADIATION