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Title: External circuit integration with electromagnetic particle in cell modeling of plasma focus devices

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.4916046· OSTI ID:22408262

The pinch performance of a plasma focus (PF) device is sensitive to the physical conditions of the breakdown phase. It is therefore essential to model and study the initial phase in order to optimize device performance. An external circuit is self consistently coupled to the electromagnetic particle in cell code to model the breakdown and initial lift phase of the United Nations University/International Centre for Theoretical Physics (UNU-ICTP) plasma focus device. Gas breakdown during the breakdown phase is simulated successfully, following a drop in the applied voltage across the device and a concurrent substantial rise in the circuit current. As a result, the plasma becomes magnetized, with the growing value of the magnetic field over time leading to the gradual lift off of the well formed current sheath into the axial acceleration phase. This lifting off, with simultaneous outward sheath motion along the anode and vertical cathode, and the strong magnetic fields in the current sheath region, was demonstrated in this work, and hence validates our method of coupling the external circuit to PF devices. Our method produces voltage waveforms that are qualitatively similar to the observed experimental voltage profiles of the UNU-ICTP device. Values of the mean electron energy before and after voltage breakdown turned out to be different, with the values after breakdown being much lower. In both cases, the electron energy density function turned out to be non-Maxwellian.

OSTI ID:
22408262
Journal Information:
Physics of Plasmas, Vol. 22, Issue 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 1070-664X
Country of Publication:
United States
Language:
English