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Title: Structural, magnetic, and transport properties of sputtered hexagonal MnNiGa thin films

Abstract

We report on a systematical study of the structure, magnetism, and magnetotransport behavior of the hexagonal MnNiGa films deposited on thermally oxidized Si (001) substrates by magnetron sputtering. X-ray diffractions reveal that all the films deposited at different temperatures crystallized in hexagonal Ni{sub 2}In-type structure (space group P6{sub 3}/mmc). Scanning electron microscopy observations show that the surface morphology of the films varies with deposition temperature, and energy dispersive spectroscopy analysis shows compositions of the films remain nearly unchanged, independent of the deposition temperature. Magnetic measurements indicate that all films are ferromagnetic and exhibit a magnetic anisotropy behavior. The magnetoresistance (MR) exhibits a negative temperature- and field-dependent behavior. The possible origin of the negative MR is discussed. Furthermore, we found that the Hall effect is dominated by an anomalous Hall effect (AHE) only due to skew scattering independent of the deposition temperature of films. Moreover, the anomalous Hall resistivity presents a non-monotonously temperature-dependent behavior.

Authors:
 [1]; ; ;  [2];  [1]
  1. State Key Laboratory of Metastable Material Sciences and Technology, Yanshan University of Technology, Qinhuangdao 066004 (China)
  2. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China)
Publication Date:
OSTI Identifier:
22402775
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 116; Journal Issue: 22; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ANISOTROPY; DEPOSITION; DEPOSITS; HALL EFFECT; HCP LATTICES; MAGNETISM; MAGNETORESISTANCE; MAGNETRONS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SPACE GROUPS; SPECTROSCOPY; SPUTTERING; SUBSTRATES; SURFACES; TEMPERATURE DEPENDENCE; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Li, Yueqing, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, Liu, E. K., Wu, G. H., Wang, Wenhong, and Liu, Zhongyuan. Structural, magnetic, and transport properties of sputtered hexagonal MnNiGa thin films. United States: N. p., 2014. Web. doi:10.1063/1.4903943.
Li, Yueqing, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, Liu, E. K., Wu, G. H., Wang, Wenhong, & Liu, Zhongyuan. Structural, magnetic, and transport properties of sputtered hexagonal MnNiGa thin films. United States. https://doi.org/10.1063/1.4903943
Li, Yueqing, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, Liu, E. K., Wu, G. H., Wang, Wenhong, and Liu, Zhongyuan. 2014. "Structural, magnetic, and transport properties of sputtered hexagonal MnNiGa thin films". United States. https://doi.org/10.1063/1.4903943.
@article{osti_22402775,
title = {Structural, magnetic, and transport properties of sputtered hexagonal MnNiGa thin films},
author = {Li, Yueqing and Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 and Liu, E. K. and Wu, G. H. and Wang, Wenhong and Liu, Zhongyuan},
abstractNote = {We report on a systematical study of the structure, magnetism, and magnetotransport behavior of the hexagonal MnNiGa films deposited on thermally oxidized Si (001) substrates by magnetron sputtering. X-ray diffractions reveal that all the films deposited at different temperatures crystallized in hexagonal Ni{sub 2}In-type structure (space group P6{sub 3}/mmc). Scanning electron microscopy observations show that the surface morphology of the films varies with deposition temperature, and energy dispersive spectroscopy analysis shows compositions of the films remain nearly unchanged, independent of the deposition temperature. Magnetic measurements indicate that all films are ferromagnetic and exhibit a magnetic anisotropy behavior. The magnetoresistance (MR) exhibits a negative temperature- and field-dependent behavior. The possible origin of the negative MR is discussed. Furthermore, we found that the Hall effect is dominated by an anomalous Hall effect (AHE) only due to skew scattering independent of the deposition temperature of films. Moreover, the anomalous Hall resistivity presents a non-monotonously temperature-dependent behavior.},
doi = {10.1063/1.4903943},
url = {https://www.osti.gov/biblio/22402775}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 22,
volume = 116,
place = {United States},
year = {Sun Dec 14 00:00:00 EST 2014},
month = {Sun Dec 14 00:00:00 EST 2014}
}