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Title: Comment on “Assessment of field-induced quantum confinement in heterogate germanium electron–hole bilayer tunnel field-effect transistor” [Appl. Phys. Lett. 105, 082108 (2014)]

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4905865· OSTI ID:22399143
; ; ;  [1]
  1. Department of Electrical and Computer Engineering and Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758 (United States)

No abstract prepared.

OSTI ID:
22399143
Journal Information:
Applied Physics Letters, Vol. 106, Issue 2; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English