A simple and wide-range refractive index measuring approach by using a sub-micron grating
- Department of Power Mechanical Engineering, National Tsing Hua University, 101 Section 2, Kuang-Fu Road, Hsinchu 30013, Taiwan (China)
This paper presents the design and simulation results of a high-precision low-cost refractometer that demonstrates the main advantage of a wide measurement range (1 ≤ n ≤ 2). The proposed design is based on the diffractive properties of sub-micron gratings and Snell's Law. The precision and uncertainty factors of the proposed system were tested and analyzed, revealing that the proposed refractometer demonstrates a wide measurement range with sensitivity of 10{sup −4}.
- OSTI ID:
- 22398894
- Journal Information:
- Applied Physics Letters, Vol. 106, Issue 15; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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