Confocal shift interferometry of coherent emission from trapped dipolar excitons

Journal Article · Mon Dec 15 00:00:00 EST 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4904222· OSTI ID:22395512

Repp, J. ^[1]; Schinner, G. J.; Schubert, E. ^[2]; Rai, A. K.; Wieck, A. D. ^[3]; Reuter, D. ^[3]; Wurstbauer, U.; Holleitner, A. W. ^[1]; others, and

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1. Walter Schottky Institut and Physik-Department, Am Coulombwall 4a, Technische Universität München, D-85748 Garching (Germany)
2. Nanosystems Initiative Munich (NIM), Schellingstr. 4, 80799 München (Germany)
3. Angewandte Festkörperphysik, Ruhr-Universität Bochum, Universitätsstraße 150, 44780 Bochum (Germany)

We introduce a confocal shift-interferometer based on optical fibers. The presented spectroscopy allows measuring coherence maps of luminescent samples with a high spatial resolution even at cryogenic temperatures. We apply the spectroscopy onto electrostatically trapped, dipolar excitons in a semiconductor double quantum well. We find that the measured spatial coherence length of the excitonic emission coincides with the point spread function of the confocal setup. The results are consistent with a temporal coherence of the excitonic emission down to temperatures of 250 mK.

• OSTI ID: 22395512
• Journal Information: Applied Physics Letters, Vol. 105, Issue 24; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COHERENCE LENGTH
EMISSION SPECTROSCOPY
EXCITONS
INTERFEROMETRY
LUMINESCENCE
OPTICAL FIBERS
QUANTUM WELLS
SEMICONDUCTOR MATERIALS
SPATIAL RESOLUTION
TEMPERATURE RANGE 0000-0013 K
TRAPPING